Rudolph AutoEL IV
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Rudolph Ellipsometer AutoEL IV - Refurbished AutoEL SeriesThe AutoEL IV's design represents an understanding of the need for flexibility and precision in a film thickness tool: A three wavelength light source allows the versatility of choosing the wavelength best suited for the sample being measured, and helps to eliminate order ambiguities and other problems associated with measuring near full cycle thickness. The three wavelength system has a built-in "fail safe system" that automatically switches the optical system to the selected wavelength and makes the required changes to the data reduction software, providing ease of operation. A master/slave microprocessor with expanded data reduction software adds to the AutoEL lV's capability to measure a wide range of samples with great precision and accuracy. |
Preventative Maintenance ProgramOverview
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