CDE ResMap Model 273
For CDE refurbished equipment:
For CDE spare parts and upgrades:
For CDE equipment service / maintenance:
Based on the technology of the Model 178, the ResMap Model 273 was the first 300 mm table top four point probe delivered to the semiconductor industry. The Model 273 extends the capability and performance of previous ResMap models to meet the needs of the 300 mm process development and large substrate film characterization. The small footprint and rugged design have the same accuracy and repeatability that define ResMap metrology.